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Japan Electronics JSM-7200F Thermal Field Emission Scanning Electron Microscope
Japan Electronics JSM-7200F Thermal Field Emission Scanning Electron Microscope
Product details
The electronic optical system of JSM-7200F adopts the submerged Schottky electron gun technology used in Japan's flagship electronic machine JSM-7800F Prime, and comes standard with the TTLS system (Through The Lens System). Whether under high/low acceleration voltage, the spatial resolution has been greatly improved compared to traditional models. In addition, ensuring a maximum beam current of 300nA, it can balance high-resolution observation and high-throughput analysis, and has abundant automatic functions and ease of use, making it a new generation of multifunctional field emission scanning electron microscopy.
<Features>
The main features of JSM-7200F include: an electron optical system utilizing submerged Schottky electron gun technology; A TTLS system (Through The Lens System) that utilizes GB (Gentle Beam mode) and various detectors for high-resolution observation and signal selection at low acceleration voltages; Hybrid objective lens with electromagnetic field superposition.
Immersion Schottky electron gun
Immersion Schottky field emission electron gun is a patented technology of Japanese electronics. By optimizing the electron gun and low aberration condenser, it can effectively utilize the electrons emitted from the electron gun, and obtain very fine beam spots even if the electron beam current is large. Therefore, high-throughput analysis (EDS, WDS surface analysis, EBSD analysis, etc.) can be achieved.
TTLS (through the lens system)
TTLS (through the lens system) is a system that utilizes GB (Gentle Beam mode) for high-resolution observation and signal selection at low acceleration voltages. By using the Gentle Beam mode (GB) to bias the sample, the incident electrons are slowed down and the emitted electrons in the sample are accelerated. Even at low acceleration voltages (incident voltages), high-resolution images with good signal-to-noise ratio can be obtained.
In addition, by using the energy filter installed in TTLS to filter the voltage, the detection amount of secondary electrons can be adjusted. In this way, under extremely low acceleration voltage conditions, a high-level detector (UED) can only capture large angle backscattered electrons from the shallow surface of the sample. Due to the filtering voltage, low-energy electrons that were not detected by UED can be detected by a high-level secondary electron detector (USD, optional). Therefore, JSM-7200F can simultaneously obtain secondary electron images and backscattered electron images.
Hybrid objective lens (electromagnetic field superposition)
The objective lens of JSM-7200F adopts our company's newly developed hybrid lens.
This hybrid lens is an electromagnetic field superposition objective that combines a magnetic lens and an electrostatic lens. It has smaller aberrations than traditional out lens and can achieve higher spatial resolution. JSM-7200F still maintains the out lens usability, allowing for observation and analysis of magnetic material samples.
<Features>
The main features of JSM-7200F include: an electron optical system utilizing submerged Schottky electron gun technology; A TTLS system (Through The Lens System) that utilizes GB (Gentle Beam mode) and various detectors for high-resolution observation and signal selection at low acceleration voltages; Hybrid objective lens with electromagnetic field superposition.
Immersion Schottky electron gun
Immersion Schottky field emission electron gun is a patented technology of Japanese electronics. By optimizing the electron gun and low aberration condenser, it can effectively utilize the electrons emitted from the electron gun, and obtain very fine beam spots even if the electron beam current is large. Therefore, high-throughput analysis (EDS, WDS surface analysis, EBSD analysis, etc.) can be achieved.
TTLS (through the lens system)
TTLS (through the lens system) is a system that utilizes GB (Gentle Beam mode) for high-resolution observation and signal selection at low acceleration voltages. By using the Gentle Beam mode (GB) to bias the sample, the incident electrons are slowed down and the emitted electrons in the sample are accelerated. Even at low acceleration voltages (incident voltages), high-resolution images with good signal-to-noise ratio can be obtained.
In addition, by using the energy filter installed in TTLS to filter the voltage, the detection amount of secondary electrons can be adjusted. In this way, under extremely low acceleration voltage conditions, a high-level detector (UED) can only capture large angle backscattered electrons from the shallow surface of the sample. Due to the filtering voltage, low-energy electrons that were not detected by UED can be detected by a high-level secondary electron detector (USD, optional). Therefore, JSM-7200F can simultaneously obtain secondary electron images and backscattered electron images.
Hybrid objective lens (electromagnetic field superposition)
The objective lens of JSM-7200F adopts our company's newly developed hybrid lens.
This hybrid lens is an electromagnetic field superposition objective that combines a magnetic lens and an electrostatic lens. It has smaller aberrations than traditional out lens and can achieve higher spatial resolution. JSM-7200F still maintains the out lens usability, allowing for observation and analysis of magnetic material samples.
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